首页> 外国专利> SILICON SINGLE CRYSTAL DOPED WITH GALLIUM INDIUM OR ALUMINUM

SILICON SINGLE CRYSTAL DOPED WITH GALLIUM INDIUM OR ALUMINUM

机译:掺有镓铟或铝的硅单晶

摘要

There is disclosed a method for preparing a doped silicon single crystal and one or a series of doped silicon crystals having a resistance change of 10% or less along the longitudinal axis and / or the radial axis. The method comprises the steps of providing a molten material containing silicon into a continuous Czochralski crystal growth apparatus, transporting a dopant such as gallium, indium, or aluminum to the molten material, Providing seed crystals into the molten material and evolving the doped silicon single crystal by evacuating the seed crystals from the molten material. Additional molten material is provided to the device during the growth phase. A doping model for calculating the amount of dopant to be carried into the molten material during one or more doping events, a method for conveying the dopant, a container and a container used to convey the dopant are also disclosed.
机译:公开了一种用于制备沿纵轴和/或径向具有10%或更小的电阻变化的掺杂硅单晶和一个或一系列掺杂硅晶体的方法。该方法包括以下步骤:将包含硅的熔融材料提供到连续的直拉晶体生长设备中;将诸如镓,铟或铝的掺杂剂输送到熔融材料中;将晶种提供到熔融材料中;以及使掺杂的硅单晶发展通过从熔融材料中抽出籽晶。在生长阶段将额外的熔融材料提供给设备。还公开了一种用于在一个或多个掺杂事件期间计算要带入熔融材料中的掺杂剂的量的掺杂模型,一种用于输送掺杂剂的方法,一种容器以及一种用于输送掺杂剂的容器。

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