首页> 外国专利> W SCR Apparatus Selecting Polarized Wave for SCR Improvement in W-Band Millimeter Wave Seeker and Method thereof

W SCR Apparatus Selecting Polarized Wave for SCR Improvement in W-Band Millimeter Wave Seeker and Method thereof

机译:W波段毫米波寻找器中用于SCR改善的W SCR装置选择极化波及其方法

摘要

The present invention relates to an apparatus to select a polarized wave and a method thereof. More specifically, the present invention relates to an apparatus to select a polarized wave, which varies the polarized wave angle in consideration of power of a receiving clutter within a polarized wave scope adjacent to a pre-saved polarized wave angle and distinguishes a target from a clutter signal. According to the present invention, the apparatus to select a polarized wave comprises: a first clutter processing unit to radiate a first polarized wave signal of a first polarized wave angle to detect a target at a pre-saved radiation angle and to perform a Fourier transform of a first reception signal, which is received as the radiated first polarized wave signal is reflected, thereby calculating the size of the first clutter signal reflected in a clutter; a second clutter processing unit to radiate second polarized wave signals at a polarized wave angle adjacent to a pre-saved second polarized wave angle in accordance with the radiation angle and to perform a Fourier transform of second reception signals received as the radiated second polarized wave signals are reflected, thereby calculating the size of second clutter signals reflected in the clutter; and a polarized wave selection unit to compare the calculated sizes of the first clutter signal and second clutter signals and to select a polarized wave direction of a target signal to detect the target.
机译:选择偏振波的装置及其方法技术领域本发明涉及选择偏振波的装置及其方法。更具体地,本发明涉及一种选择偏振波的设备,该设备考虑到与预先保存的偏振波角相邻的偏振波范围内的接收杂波的功率来改变偏振波角,并且将目标与杂波信号。根据本发明,选择偏振波的设备包括:第一杂波处理单元,其辐射第一偏振波角的第一偏振波信号,以预先保存的辐射角检测目标并执行傅立叶变换。作为辐射的第一偏振波信号被反射的第一接收信号的反射,从而计算在杂波中反射的第一杂波信号的大小;第二杂波处理单元,根据辐射角以与预先保存的第二偏振波角相邻的偏振波角辐射第二偏振波信号,并对作为辐射第二偏振波信号接收的第二接收信号进行傅立叶变换反射,从而计算在杂波中反射的第二杂波信号的大小;偏振波选择单元,其比较计算出的第一杂波信号和第二杂波信号的大小,并选择目标信号的偏振波方向以检测目标。

著录项

  • 公开/公告号KR101846020B1

    专利类型

  • 公开/公告日2018-04-05

    原文格式PDF

  • 申请/专利权人 LIG NEX1 CO. LTD.;

    申请/专利号KR20170165357

  • 发明设计人 PARK SUNG HO;KWON JUN BEOM;KIM HONG RAK;

    申请日2017-12-04

  • 分类号F41G7/22;F42B15/01;G01S13/88;

  • 国家 KR

  • 入库时间 2022-08-21 12:38:06

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