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METHOD OF PREPARING SURFACE OF InSb SUBSTRATE FOR HETEROSTRUCTURE CULTIVATION BY METHOD OF MOLECULAR-BEAM EPITAXY

机译:分子束外延法制备用于异质结构的InSb基质表面的方法

摘要

FIELD: electricity.;SUBSTANCE: in method of preparing surface of InSb substrate for heterostructure cultivation by molecular-beam by epitaxy InSb substrate surface pretreatment is carried out with the modification of the composition of residual oxide layer. Modification of the composition of residual oxide layer on the surface of substrate take place with receipt of hydrated amorphous oxide layer of oxide compounds of indium and antimony, characterized by nonstoichiometric composition - of hydrated oxide compounds enriched indium. First, the anodic oxidation of substrate with the residual oxide layer is carried out in the water-containing alkaline medium, and then the oxide layer obtained during the oxidation is removed in a water-containing acid medium. In the end, modified residual oxide layer is removed in the vacuum chamber molecular-beam epitaxy installation using substrate heat treatment.;EFFECT: ensuring reduction in the temperature at which the oxide layer is completely removed in the growth chamber of molecular beam epitaxy to less than 400 degrees.;7 cl, 1 dwg
机译:领域:电;物质:在通过外延通过分子束制备用于异质结构培养的InSb衬底表面的方法中,对InSb衬底表面进行预处理以改变残留氧化物层的组成。在基底表面上残留的氧化物层的组成的改变发生在铟和锑的氧化物的水合无定形氧化物层的接收中,该水合的无定形氧化物层的特征在于非化学计量组成的富含铟的水合的氧化物的特征。首先,在含水碱性介质中对具有残留氧化物层的基板进行阳极氧化,然后在含水酸性介质中去除在氧化过程中获得的氧化层。最后,使用衬底热处理在真空室分子束外延装置中去除了改性残留氧化物层;效果:确保将分子束外延生长室中被完全去除的氧化物层的温度降低到更低比400度; 7 cl,1 dwg

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