FIELD: test technology.;SUBSTANCE: invention relates to the field of testing of electronic equipment. Essence: each nonrecoverable redundant device contains N (N1) non-reserved radioelectronic devices with an exponential law of failure probability distribution, each representing k (0k≤N-1) main and n (n = Nk) back-up radioelectronic devices. Tests are carried out by a single-step method with a limited test time. As a criterion of the limiting state of a redundant electronic device, refusal is accepted. At the end of the tests, the number of failed redundant electronic devices is determined. If the number of failing redundant electronic devices is less than or equal to the acceptance number of failures, the test results are considered positive, otherwise negative. Reduction of test time in comparison with the given gamma-percentage resource is achieved due to the fact, that in the testing by failed redundant electronic device, counting each redundant radioelectronic device having at least one failed electronic device from its N radio electronic devices.;EFFECT: reduction of testing time for the gamma-percentile life of non-recoverable redundant radioelectronic devices.;1 cl, 4 ex
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