METHOD OF GAMMA-PERCENTILE LIFE VALIDATION TESTS FOR NON-RECOVERABLE RADIOELECTRONIC DEVICES UNDER EXPONENTIAL LAW OF FAILURE PROBABILITY DISTRIBUTION

摘要

FIELD: electricity.;SUBSTANCE: test time is accepted as the time reduced per m times (where m is a positive integer number bigger than 1) to the preset value of gamma-percentile life due to increase in m times of a number of the tested radioelectronic devices and their subdivision into similar groups with m of radioelectronic devices. Out of the number of radioelectronic devices failed during the test one device is selected from each group with failed radioelectronic devices. When the total number of the selected radioelectronic devices is less than the acceptance number of failures or equal to it, then test results are assumed as positive otherwise they are considered as negative.;EFFECT: reduction of time for gamma-percentile life tests.