METHOD AND DEVICE FOR INVESTIGATING INSPECTION SYSTEM USED FOR DETECTING SURFACE DEFECTS

摘要

FIELD: measurement; testing.;SUBSTANCE: group of inventions relates to a method and apparatus for investigating an inspection system used for detecting surface defects in a product. This method for investigating inspection system (1) and system for realizing the method for detecting surface defects (2, 3) of product (5), preferably a flat steel product, in which, using single camera (6), preferably a digital camera, one photograph (10) of surface (4) of single product (5) is made, one photograph (10) that is a digital image is transmitted to image processing device (7), one digitized image (11, 12) of surface defect (2, 3) is integrated into digitized photograph (10) using image processing device (7) and with the help of digitized photograph (10), including digitized image (11, 12) of surface defect (2, 3), a defect is revealed and it is determining whether image processing device (7) recognizes digitized image (11, 12) of surface defect (2, 3) as a defect on surface (4) being investigated. As digitized image (11, 12) of the surface defect, an artificially created image is used which is a surface with different shades of gray and different degrees of contrast.;EFFECT: technical result consists in the absence of a significant disruption in the production of products and in the improvement of the method for investigating the inspection system used for detecting surface defects.;15 cl, 3 dwg