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Measurement system and method for combined acquisition of surface topography and hyperspectral imaging

机译:表面形貌与高光谱成像组合采集的测量系统及方法

摘要

In particular, the present invention relates to a method and apparatus for detecting topographical and spatially resolved spectral characteristics of a surface to be examined. In this case, the method comprises: generating an illumination pattern of a first measurement light having a multiplicity of wavelengths; imaging the illumination pattern of the first measurement light onto the surface to be examined by means of a chromatic objective such that the illumination pattern for different wavelengths of the plurality of wavelengths of the first measurement light is sharply imaged at different distances from the chromatic objective; imaging the first measurement light radiated from the surface to be examined by means of the chromatic objective onto a confocal mask which has a transmission pattern corresponding to the illumination pattern; a spectral splitting of the first measuring light transmitted through the confocal mask; a spatially resolved detection of a 2-dimensional intensity distribution of the spectrally split first measurement light by means of a detector; determining the topographic properties of the surface to be examined on the basis of the intensity distribution of the first measuring light detected by means of the detector; a homogeneous illumination of the surface to be examined by means of a second measuring light having a plurality of wavelengths; imaging the second measurement light emitted from the surface to be examined by means of the chromatic objective onto the confocal mask; spectral splitting of the second measuring light transmitted through the confocal mask; a spatially resolved detection of a 2-dimensional intensity distribution of the spectrally split second measuring light by means of the detector; and determining the spatially resolved spectral properties of the surface to be examined on the basis of the intensity distribution of the second measuring light detected by the detector.
机译:特别地,本发明涉及一种用于检测待检查表面的形貌和空间分辨光谱特征的方法和设备。在这种情况下,该方法包括:产生具有多个波长的第一测量光的照明图案;借助于彩色物镜将第一测量光的照明图案成像到要检查的表面上,使得第一测量光的多个波长中的不同波长的照明图案在距彩色物镜不同的距离处清晰地成像;通过彩色物镜将从待检查表面辐射的第一测量光成像到具有与照明图案相对应的透射图案的共焦掩模上;透过共焦掩模的第一测量光的光谱分裂;通过检测器对光谱分离的第一测量光的二维强度分布进行空间分辨检测;根据通过检测器检测到的第一测量光的强度分布,确定待检查表面的形貌特性;通过具有多个波长的第二测量光均匀地照射待检查的表面;通过彩色物镜将从待检查表面发射的第二测量光成像到共焦掩模上;通过共焦掩模透射的第二测量光的光谱分裂;通过检测器对光谱分离的第二测量光的二维强度分布进行空间分辨检测;根据检测器检测到的第二测量光的强度分布,确定待检查表面的空间分辨光谱特性。

著录项

  • 公开/公告号DE102017000296A1

    专利类型

  • 公开/公告日2018-07-19

    原文格式PDF

  • 申请/专利权人 BADEN-WÜRTTEMBERG STIFTUNG GGMBH;

    申请/专利号DE20171000296

  • 发明设计人 KARL STOCK;RAPHAEL MADER;

    申请日2017-01-15

  • 分类号G01B11/24;G01J3/28;G01N21/55;G01N21/31;

  • 国家 DE

  • 入库时间 2022-08-21 12:34:23

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