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Transmitter, integrated circuit, detection section and integrated circuit testing method

机译:变送器,集成电路,检测部和集成电路测试方法

摘要

An integrated circuit according to the present invention includes a transmission circuit that transmits a millimeter-wave signal, a detection section that detects the millimeter-wave signal, an output terminal that is connected to an output of the transmission circuit via a first wire, a detection terminal provided adjacent to the output terminal, and is connected to an input of the detection section via a second wire, a first ground connection terminal provided adjacent to the output terminal and connected to the transmission circuit via a first ground connection wire to connect the transmission circuit to a ground, and a second ground connection terminal adjacent thereto the detection terminal is provided and connected to the detection section via a second ground connection wire to connect the detection section to a ground, wherein the first ground connection wire and the second ground connecting wire to the first wire and the second wire are arranged.
机译:根据本发明的集成电路,包括:发送电路,其发送毫米波信号;检测部,其检测毫米波信号;输出端子,其经由第一线连接至所述发送电路的输出;以及检测端子设置成与输出端子相邻,并且经由第二线连接到检测部的输入,第一接地端子设置成与输出端子相邻并且经由第一接地连接线与传输电路连接,以将第一传输电路接地,并且提供与检测端子相邻的第二接地连接端子,并且经由第二接地连接线将检测端子连接到检测部分,以将检测部分接地,其中第一接地连接线和第二接地将连接线连接到第一线和第二线。

著录项

  • 公开/公告号DE102017212760A1

    专利类型

  • 公开/公告日2018-03-08

    原文格式PDF

  • 申请/专利权人 MITSUBISHI ELECTRIC CORPORATION;

    申请/专利号DE201710212760

  • 发明设计人 YOSHINORI TAKAHASHI;

    申请日2017-07-25

  • 分类号G01R31/28;H01L21/66;G08C17/02;

  • 国家 DE

  • 入库时间 2022-08-21 12:33:56

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