首页> 外国专利> ISFET SENSOR ARRAY COMPRISING TITANIUM NITRIDE AS A SENSING LAYER LOCATED ON THE BOTTOM OF A MICROWELL STRUCTURE

ISFET SENSOR ARRAY COMPRISING TITANIUM NITRIDE AS A SENSING LAYER LOCATED ON THE BOTTOM OF A MICROWELL STRUCTURE

机译:包含氮化钛的ISFET传感器阵列,作为位于微孔结构底部的传感层

摘要

A method of fabricating a microwell in an array structure is disclosed herein. The array structure can include a plurality of field effect transistors (FETs), where each FET has a gate structure. The method can include disposing a titanium nitride (TiN) layer on at least one conductive layer coupled to the gate structure of at least one FET. A insulation layer can also be disposed on the array structure, where the insulation layer lies above the TiN layer. Further, an opening above the gate structure of the at least one FET can be etched to remove the insulation layer above the gate structure and to expose the TiN layer. A microwell with at least one sidewall formed from the insulation layer and with a bottom surface formed from the TiN layer is a result of the etching process.
机译:本文公开了一种以阵列结构制造微孔的方法。阵列结构可以包括多个场效应晶体管(FET),其中每个FET具有栅极结构。该方法可以包括在耦合到至少一个FET的栅极结构的至少一个导电层上设置氮化钛(TiN)层。绝缘层也可以设置在阵列结构上,其中绝缘层位于TiN层上方。此外,可蚀刻至少一个FET的栅极结构上方的开口以去除栅极结构上方的绝缘层并暴露TiN层。具有蚀刻的结果是具有至少一个由绝缘层形成的侧壁和具有由TiN层形成的底表面的微孔。

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