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Precision measurement of voltage drop across a semiconductor switching element
Precision measurement of voltage drop across a semiconductor switching element
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机译:精确测量半导体开关元件上的压降
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摘要
The present invention discloses a kind of pressure drops for accurate measurement across thyristor. The device includes(a)First circuit paths include the first protection element,First impedor and voltage source(Control),Wherein the first circuit paths are suitable for the thyristor being connected between first terminal and Second terminal,(Two)The first lead-out terminal formed between second circuit path( 211 )With second output terminal( 212 ),The second circuit channel,Including second the second impedor of protection element,Wherein the second protection element and the first protection element,Wherein the second impedor and the first impedor,(Three)Adjusting circuit and adjusting currently makes the electric current be equal to the first circuit path in the electric current in second circuit path in second circuit path,Wherein isometric systolic contraction dramatically shortens speed(Voltage drop)First terminal and Second terminal between thyristor voltage between difference be equal to voltage source provided by(Control)With voltage drop(Velocity modulation)In the first output end( 211 )With second output terminal( 212 ). Moreover, there are the seabed installations, monitoring system and method.
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