Apparatus for measuring industrial products manufactured by extrusion techniques

摘要

The invention relates to apparatus for monitoring extruded products (10) moving in an inline extrusion process so as to effect quality control of the process by continuously measuring dimensional parameters and determining the existence of contaminants in the extrusion. The apparatus makes use of Terahertz radiation (13) which is adapted to provide a curtain of parallel rays of the radiation which is scanned across the product (10) as the product (10) passes therethrough in a linear manner. The composition of the omitted radiation received after the scanning process is subject to an imaging analysis to determine the dimensional parameters and contaminant free integrity of the extrusion process.