首页>
外国专利>
NONDESTRUCTIVE INSPECTION DEVICE AND METHOD FOR CORRECTING LUMINANCE DATA WITH NONDESTRUCTIVE INSPECTION DEVICE
NONDESTRUCTIVE INSPECTION DEVICE AND METHOD FOR CORRECTING LUMINANCE DATA WITH NONDESTRUCTIVE INSPECTION DEVICE
展开▼
机译:非破坏性检查装置及利用非破坏性检查装置校正亮度数据的方法
展开▼
页面导航
摘要
著录项
相似文献
摘要
A nondestructive inspection device 1 comprises an X-ray indicator 20, a low-energy detector 32, a high-energy detector 42, a low-energy transmittance calculation unit 72, a high-energy transmittance calculation unit 74, a detection unit 76, and a correction unit 78. The calculation unit 72 calculates a value indicating the transmittance of transmission X-rays in a low energy range. The calculation unit 74 calculates a value indicating the transmittance of transmission X-rays in a high energy range. The detection unit 76 detects a positional deviation detail of the X-ray indicator 20 according to a ratio between the transmittances calculated by both of the calculation units 72, 74. When the positional deviation detail of the X-ray indicator 20 is detected by the detection unit 76, according to the positional deviation detail, the correction unit 78 corrects X-ray luminance data detected by the detectors 32, 42.
展开▼