首页> 外国专利> THICKNESS LOSS DETECTION DEVICE, THICKNESS LOSS DETECTION SYSTEM, THICKNESS LOSS DETECTION METHOD, AND PROGRAM

THICKNESS LOSS DETECTION DEVICE, THICKNESS LOSS DETECTION SYSTEM, THICKNESS LOSS DETECTION METHOD, AND PROGRAM

机译:厚度损失检测装置,厚度损失检测系统,厚度损失检测方法及程序

摘要

A material defect detection device, a material defect detection system, a material defect detection method, and a program which can easily estimate shape information of a material defect are provided. A material defect detection device for detecting material defect in a predetermined region of a metallic equipment using a magnetic field distribution in the predetermined region measured by a magnetic sensor array, the material defect detection device being provided with a magnetic dipole density distribution calculator for calculating a density distribution of magnetic dipoles in the predetermined region based on the magnetic field distribution measured by the magnetic sensor array, and a depth distribution calculator for calculating a depth distribution of material defect in the predetermined region based on the density distribution of the magnetic dipoles.
机译:提供了一种材料缺陷检测装置,材料缺陷检测系统,材料缺陷检测方法以及能够容易地估计材料缺陷的形状信息的程序。一种材料缺陷检测装置,用于利用由磁传感器阵列测量的预定区域中的磁场分布来检测金属设备的预定区域中的材料缺陷,该材料缺陷检测装置设置有用于计算磁导率的磁偶极子密度分布计算器。基于由磁传感器阵列测量的磁场分布在预定区域中的磁偶极子的密度分布,以及用于基于磁偶极子的密度分布来计算预定区域中的材料缺陷的深度分布的深度分布计算器。

著录项

  • 公开/公告号EP3537144A1

    专利类型

  • 公开/公告日2019-09-11

    原文格式PDF

  • 申请/专利权人 YOKOGAWA ELECTRIC CORPORATION;

    申请/专利号EP20170868335

  • 发明设计人 ISHIKAWA TETSUYA;YOSHIDA HIDEKI;

    申请日2017-10-23

  • 分类号G01N27/82;

  • 国家 EP

  • 入库时间 2022-08-21 12:29:39

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号