首页> 外国专利> ALPHA PARTICLE DETECTION APPARATUS USING DUAL PROBE STRUCTURED IONIZATION CHAMBER AND DIFFERENTIAL AMPLIFIER

ALPHA PARTICLE DETECTION APPARATUS USING DUAL PROBE STRUCTURED IONIZATION CHAMBER AND DIFFERENTIAL AMPLIFIER

机译:双探头结构电离室和差分放大器的α粒子检测装置

摘要

Disclosed in an alpha particle detection apparatus using a dual probe structured ionization chamber and a differential amplifier, the apparatus including: an ionization chamber forming electric field thereinside by bias power applied to a surface thereof; a main probe unit absorbing ionic charges generated in an occurrence of alpha (±) decay in the ionization chamber; a guard ring unit absorbing leakage current generated between the ionization chamber and the main probe unit and flowing the leakage current to a ground; an auxiliary probe allowing surrounding noise to be introduced therein; first and second preamplifiers amplifying fine electrical signals to a predetermined magnitude; and a differential canceling a noise signal and outputting an alpha particle detection signal by amplifying a voltage difference between the preamplified electrical signals. As such, it is possible to effectively detect alpha (±) particles which are a type of radiation.
机译:在使用双探针结构的电离室和差分放大器的α粒子检测设备中,该设备包括:电离室,该电离室通过施加在其表面上的偏置功率在其中形成电场;以及电离室。主探针单元吸收在电离室中发生α(±)衰减时产生的离子电荷;保护环单元,其吸收在电离室和主探针单元之间产生的泄漏电流并使泄漏电流流向地面;辅助探针,允许将周围的噪声引入其中;第一和第二前置放大器将精细的电信号放大到预定大小;差分消除噪声信号,并通过放大预放大的电信号之间的电压差来输出α粒子检测信号。这样,可以有效地检测作为放射线的α(±)粒子。

著录项

  • 公开/公告号EP3252505B1

    专利类型

  • 公开/公告日2018-12-26

    原文格式PDF

  • 申请/专利权人 FTLAB CO. LTD.;

    申请/专利号EP20160839448

  • 发明设计人 KO JAE JUN;KIM YOUNG GWEON;

    申请日2016-07-21

  • 分类号G01T1/185;G01T1/178;H01J47/02;

  • 国家 EP

  • 入库时间 2022-08-21 12:29:02

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