A coverage test support device includes a memory device that stores a test case and a specification content of each of a plurality of coverage indexes, and an arithmetic device that sequentially gives a test input value of each pair in the test case to a program created by a neural network, executes a predetermined number of tests, and acquires a test result of the tests and neuron information at the time of test execution, applies the acquired neuron information to the specification content of each of the plurality of coverage indexes and calculates a value for each coverage index, and identifies, among the coverage indexes, a coverage index in which an elongation rate of the calculated value shows a predetermined tendency, as a preferential coverage index that is to be used preferentially, when either the number of executions of the tests or the number of bugs in the test result exceeds a predetermined standard.
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