A coverage test support device includes a memory device that stores a test case and specification content of each of a plurality of coverage indexes, and an arithmetic device that sequentially gives a test input value of each pair in the test case to a program created by a neural network, executes a predetermined number of tests, and acquires a test result of the tests and neuron information at the time of test execution, applies the acquired neuron information to the specification content of each coverage indexes and calculates a value for each coverage index, and identifies, among the coverage indexes, a coverage index in which an elongation rate of the calculated value shows a predetermined tendency, as a preferential coverage index that is to be used preferentially, when either the number of executions of the tests or the number of bugs in the test result exceeds a predetermined standard.
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