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MAKEUP TREND ANALYSIS DEVICE, MAKEUP TREND ANALYSIS METHOD, AND MAKEUP TREND ANALYSIS PROGRAM

机译:化妆趋势分析装置,化妆趋势分析方法和化妆趋势分析程序

摘要

There are included facial feature point acquiring unit (340) that acquires a facial feature point within a makeup facial image that is an image of a face on which makeup is applied, makeup feature point acquiring unit (350) that acquires a makeup feature point within the makeup facial image, makeup information generator (360) that generates, based on the facial feature point and the makeup feature point, makeup information quantitatively indicating information about a position of the makeup feature point in a face coordinate system that takes the facial feature point as a reference, trend analyzer (380) that analyzes the makeup information acquired from a plurality of the makeup facial images, and determines a makeup trend, and analysis result output unit (390) that performs an information output process according to a determination result of the makeup trend.
机译:包括面部特征点获取单元(340),该面部特征点获取单元(340)获取作为应用了化妆的脸部图像的化妆面部图像内的面部特征点;以及化妆特征点获取单元(350),其在内部获取化妆特征点。化妆面部图像,化妆信息生成器(360),其基于面部特征点和化妆特征点,生成定量地表示关于化妆特征点在采用该面部特征点的面部坐标系中的位置的信息的化妆信息作为参考,趋势分析器(380)分析从多个化妆面部图像获取的化妆信息,并确定化妆趋势,并且分析结果输出单元(390)根据信息的确定结果进行信息输出处理。化妆趋势。

著录项

  • 公开/公告号EP3407290A4

    专利类型

  • 公开/公告日2018-11-28

    原文格式PDF

  • 申请/专利号EP20160886220

  • 发明设计人 TAKEI ICHIRO;

    申请日2016-11-22

  • 分类号G06Q50/10;A45D44;G06T1;

  • 国家 EP

  • 入库时间 2022-08-21 12:25:45

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