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SPECTROSCOPY MEASURING DEVICE, ELECTRONIC APPARATUS, AND SPECTROSCOPY MEASURING METHOD

机译:光谱测量装置,电子仪器及光谱测量方法

摘要

To provide a spectroscopy measuring device, capable of increasing degree of freedom of placement position of a reference object, an electronic apparatus and a spectroscopy measuring method.SOLUTION: The spectroscopy measuring device includes a spectroscope 17 for measuring the amount of light relevant to a plurality of wavelengths of light from an object, and an arithmetic unit 154 that calculates the reflection rate of the object on the basis of the measurement result of the amount of light with respect to the plurality of wavelengths. The arithmetic unit calculates the reflection rate of the object by applying transformation matrix for converting the measurement result into the reflection rate to the measurement result.SELECTED DRAWING: Figure 2
机译:为了提供一种能够增加参考对象的放置位置的自由度的光谱测量装置,电子设备和光谱测量方法。解决方案:光谱测量装置包括用于测量与多个相关的光量的光谱仪17。来自物体的光的波长,以及运算单元154,该运算单元154基于相对于多个波长的光量的测量结果来计算物体的反射率。算术单元通过应用变换矩阵来计算对象的反射率,该变换矩阵将测量结果转换为测量结果的反射率。图2

著录项

  • 公开/公告号JP2019113494A

    专利类型

  • 公开/公告日2019-07-11

    原文格式PDF

  • 申请/专利权人 SEIKO EPSON CORP;

    申请/专利号JP20170249265

  • 发明设计人 KURI RYUHEI;

    申请日2017-12-26

  • 分类号G01J3/46;

  • 国家 JP

  • 入库时间 2022-08-21 12:25:20

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