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PRE-ALIGNMENT APPARATUS AND PRE-ALIGNMENT METHOD

机译:校正前装置和校正前方法

摘要

To provide a pre-alignment apparatus and a pre-alignment method capable of transporting and pre-aligning a wafer without destroying an electronic device provided on the wafer.SOLUTION: A pre-alignment apparatus includes: chuck means 52; lift means 58 that is provided so as to be movable up and down with respect to the chuck means 52, receives and supporting a lower surface of a wafer W, and moves the wafer W to the chuck means 52; centering means 60 that centers the wafer W supported by the lift means 58; and suction means 64 that sucks nd holds an outer periphery of the lower surface of the wafer W after the wafer W supported by the lift means 58 is moved to the chuck means 52 and the lower surface of the wafer W is placed on the chuck means 52.SELECTED DRAWING: Figure 4
机译:为了提供一种预对准装置和预对准方法,该预对准装置和预对准方法能够在不破坏设置在晶片上的电子器件的情况下传送和预对准晶片。升降装置58设置成可相对于卡盘装置52上下移动,并接收并支撑晶片W的下表面,并将晶片W移动至卡盘装置52。对中装置60使由提升装置58支撑的晶片W对中。在由升降装置58支撑的晶片W移动到卡盘装置52上并将晶片W的下表面放置在卡盘装置上之后,抽吸并保持晶片W的下表面的外周的抽吸装置64保持晶片W的下表面的外围。 52.选定的图纸:图4

著录项

  • 公开/公告号JP2019161241A

    专利类型

  • 公开/公告日2019-09-19

    原文格式PDF

  • 申请/专利权人 TOKYO SEIMITSU CO LTD;

    申请/专利号JP20190117998

  • 发明设计人 OZAKI YASUYA;

    申请日2019-06-26

  • 分类号H01L21/68;

  • 国家 JP

  • 入库时间 2022-08-21 12:24:59

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