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METHODS OF STUDYING DYNAMIC SPECIMENS IN TRANSMISSION CHARGED PARTICLE MICROSCOPE

机译:透射带电粒子微观动力学特征的研究方法

摘要

To provide a method and transmission charged particle microscope for time-resolved study of dynamic/evolving specimens without a large detector or large-amplitude image/detector deflection.SOLUTION: A method includes: sparsifying a beam so as to produce mutually isolated sub-images at a detector level such that deflection of time-resolved images stays in a relatively small region within an image region; and using a scanning assembly to cause relative motion of the image and the detector so as to form the time-resolved sub-images in a neighboring region of the detector.SELECTED DRAWING: Figure 2A
机译:提供一种方法和透射带电粒子显微镜,用于时间分辨研究动态/正在演化的标本,而无需使用大型检测器或大振幅图像/检测器偏转。在检测器水平上,使得时间分辨图像的偏转保持在图像区域内的相对较小的区域中;并使用扫描组件引起图像和检测器的相对运动,以便在检测器的相邻区域中形成时间分辨的子图像。

著录项

  • 公开/公告号JP2019186197A

    专利类型

  • 公开/公告日2019-10-24

    原文格式PDF

  • 申请/专利权人 FEI CO;

    申请/专利号JP20190037196

  • 申请日2019-03-01

  • 分类号H01J37/26;H01J37/09;H01J37/147;H01J37/244;G01N23/04;

  • 国家 JP

  • 入库时间 2022-08-21 12:24:58

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