Implantation-decay method to study the β-delayed charged particle decay

摘要

In this paper,the implantation-decay method is introduced to study the β-delayed charged particle decay.A silicon detector array was used for the implantation of the incident beams and for the detection of the emitted particles.An experimental measurement on the β-delayed particle emission from ^(22)Al was used to demonstrate the method.The half-life value,charged particle spectroscopy,γ ray spectrum,and γ particle coincidence for the decay process were obtained and compared with previous experimental results for ^(22)Al.The results show that the implantation-decay method,using a silicon detector array,is a suitable experimental method to study the β-delayed charged particle decay for proton-rich nuclei.