首页> 外国专利> IRON LOSS MEASUREMENT METHOD, TEST FIXTURE OF IMPEDANCE ANALYZER, AND SAMPLE STAND OF IRON LOSS MEASUREMENT DEVICE

IRON LOSS MEASUREMENT METHOD, TEST FIXTURE OF IMPEDANCE ANALYZER, AND SAMPLE STAND OF IRON LOSS MEASUREMENT DEVICE

机译:铁损测量方法,阻抗分析仪的测试装置以及铁损测量装置的样品架

摘要

To provide an iron loss measurement method, a test fixture of an impedance analyzer, and a sample stand of an iron loss measurement device that can accurately determine frequency characteristics of a relative measurement phase error of a current flowing to a reference sample to the voltage at both ends of the reference sample required to accurately calculate the iron loss of the sample to be measured.SOLUTION: A test fixture 40 includes two binding posts 40a, 40b for connecting the reference sample for measuring the frequency characteristics and phase frequency characteristics of magnitude of impedance of the reference sample. The two binding posts 40a, 40b have the same structure, size, and material as the two binding posts of the sample stand connecting the reference sample for determining the frequency characteristics of the relative measurement phase error of a current flowing to the reference sample to the voltage at both ends of the reference sample on the basis of the phase frequency characteristics, and an interval between the two binding posts 40a, 40b is the same as the interval of the two connected components of the sample stand.SELECTED DRAWING: Figure 8
机译:为了提供铁损测量方法,阻抗分析仪的测试夹具以及铁损测量装置的样品台,其可以准确地确定流向参考样品的电流相对于电压的相对测量相位误差的频率特性。解决方案:测试夹具40包括两个接线柱40a,40b,两个接线柱40a,40b用于连接参考样品,以测量幅值的频率特性和相位频率特性。参考样品的阻抗。两个接线柱40a,40b具有与连接参考样品的样品台的两个接线柱相同的结构,尺寸和材料,以确定流向参考样品的电流相对测量相位误差的频率特性。根据相频率特性,参考样品两端的电压,两个接线柱40a,40b之间的间隔与样品台两个连接组件的间隔相同。图8

著录项

  • 公开/公告号JP2019120547A

    专利类型

  • 公开/公告日2019-07-22

    原文格式PDF

  • 申请/专利权人 IWATSU ELECTRIC CO LTD;

    申请/专利号JP20170254199

  • 申请日2017-12-28

  • 分类号G01R33/12;G01R27/02;

  • 国家 JP

  • 入库时间 2022-08-21 12:24:46

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