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SPECTRAL INSTRUMENT, HYPERSPECTRAL MEASUREMENT SYSTEM, AND SPECTROSCOPIC METHOD

机译:光谱仪器,高光谱测量系统和光谱学方法

摘要

To provide a spectral instrument capable of imaging diffraction image of each slit in a separated manner while improving wavelength resolution.SOLUTION: The spectral instrument comprises: a slit mechanism formed by arranging a plurality of slits receiving light from a target in a slit width direction; a first diffraction grating provided so as to receive light travelling via a collimation optical element; and a second diffraction grating provided to receive light split by wavelength via the first diffraction grating. Lattice spacing of the first diffraction grating is different from that of the second diffraction grating. When an optical path from the slit mechanism to a detector is viewed along a direction of travel, a diffracted orientation of the first diffraction grating with zero-th diffraction light as reference and a diffracted orientation of the second diffraction grating with zero-th diffraction light as reference are different from one another.SELECTED DRAWING: Figure 1
机译:提供一种能够在提高波长分辨率的同时分离地成像每个狭缝的衍射图像的光谱仪器。解决方案:该光谱仪器包括:狭缝机构,其通过在狭缝宽度方向上布置多个接收来自目标的光的狭缝而形成;提供第一衍射光栅,以接收通过准直光学元件传播的光;第二衍射光栅设置成通过第一衍射光栅接收按波长划分的光。第一衍射光栅的格子间隔与第二衍射光栅的格子间隔不同。当沿着行进方向观察从狭缝机构到检测器的光路时,以第零衍射光为基准的第一衍射光栅的衍射取向和以零衍射光为基准的第二衍射光栅的衍射取向。作为参考彼此不同。选图:图1

著录项

  • 公开/公告号JP2019163990A

    专利类型

  • 公开/公告日2019-09-26

    原文格式PDF

  • 申请/专利权人 HORIBA LTD;

    申请/专利号JP20180051266

  • 发明设计人 SATO SEICHI;

    申请日2018-03-19

  • 分类号G01J3/18;G01J3/04;

  • 国家 JP

  • 入库时间 2022-08-21 12:24:39

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