首页> 外国专利> CHARGED PARTICLE BEAM GENERATION DEVICE, PARTICLE BEAM THERAPY EQUIPMENT EQUIPPED WITH THE SAME, AND OPERATION METHOD OF CHARGED PARTICLE BEAM GENERATION DEVICE

CHARGED PARTICLE BEAM GENERATION DEVICE, PARTICLE BEAM THERAPY EQUIPMENT EQUIPPED WITH THE SAME, AND OPERATION METHOD OF CHARGED PARTICLE BEAM GENERATION DEVICE

机译:带电粒子束产生装置,配备有该粒子束治疗装置的粒子束治疗设备以及带电粒子束产生装置的操作方法

摘要

To provide a charged particle beam generation device capable of reducing undesired stoppage of the device while, compared to conventional, constantly maintaining a beam current emitted from a straight line accelerator with a simple constitution, a particle beam therapy equipment equipped with the same, and an operation method of charged particle beam generation device.SOLUTION: The charged particle beam generation device comprises: an ion source 2; a pull-out electrode system 5; an electrostatic lens 7 for focusing a pull-out beam 14; a straight line accelerator 9 for accelerating the pull-out beam 14; a beam current detection unit 10 for detecting a beam current of an output beam 11 or the pull-out beam 14 after having passed the electrostatic lens 7; and a control unit 13 configured to control the voltage to be applied to the electrostatic lens 7 depending on the beam current detected the beam current detection unit 10.SELECTED DRAWING: Figure 1
机译:本发明提供一种带电粒子束发生装置,一种带电粒子束发生装置以及具有该粒子束治疗装置的带电粒子束发生装置。解决方案:带电粒子束产生装置包括:离子源2;引出电极系统5;用于聚焦拉出光束14的静电透镜7;直线加速器9,用于加速拉出梁14。束电流检测单元10,用于检测通过静电透镜7后的输出束11或拉出束14的束电流。控制单元13和控制单元13,该控制单元13根据检测到的束电流检测束电流检测单元10来控制施加到静电透镜7上的电压。

著录项

  • 公开/公告号JP2019039702A

    专利类型

  • 公开/公告日2019-03-14

    原文格式PDF

  • 申请/专利权人 HITACHI LTD;

    申请/专利号JP20170159967

  • 发明设计人 SEKI TAKAYOSHI;

    申请日2017-08-23

  • 分类号G21K1/087;G21K5/04;G21K1;H05H9;H05H7/08;H01J37/04;H01J37/12;A61N5/10;H01J37/08;

  • 国家 JP

  • 入库时间 2022-08-21 12:24:38

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