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状態監視方法および状態監視装置

机译:状态监视方法及状态监视装置

摘要

To provide a state monitoring method that does not need to conduct optimization of a frequency band beforehand, and is high in determination accuracy of presence or absence of abnormality of an examined object.SOLUTION: A state monitoring method comprises: a first process of conducting filter processing with respect to measurement data using each of a plurality of band-pass filters having a mutually different center frequency, and thereby generating a plurality of first waveforms; a second process of calculating a first amount of characteristic with respect to each of the plurality of first waveforms; a third process of calculating a second amount of characteristic indicative of a characteristic of a second waveform to be obtained by plotting the center frequency of the band-pass filter and the first amount of characteristic of a time waveform generated by using the band-pass filter in a graph with the center frequency as a lateral axis and the first amount of characteristic as a vertical axis as to each of the plurality of band-pass filters; and a fourth process of determining whether an examined object is abnormal on the basis of the second amount of characteristic calculated by conducting the first to third processes with respect to test data.SELECTED DRAWING: Figure 6
机译:本发明提供一种状态监视方法,该状态监视方法不需要预先进行频带的最优化,被检查物的有无异常的判定精度高。使用具有互不相同的中心频率的多个带通滤波器中的每一个对测量数据进行处理,从而生成多个第一波形;第二过程,针对多个第一波形中的每一个计算第一特征量;第三过程,计算第二特征量,该第二特征量指示将通过绘制带通滤波器的中心频率和通过使用带通滤波器生成的时间波形的第一特征量而获得的第二波形的特征相对于多个带通滤波器的每一个,以中心频率为横轴,特性的第一量为纵轴的曲线图。图4是根据通过对测试数据进行第一至第三过程而计算出的第二特征量来确定检查对象是否异常的第四过程。

著录项

  • 公开/公告号JP2019045484A

    专利类型

  • 公开/公告日2019-03-22

    原文格式PDF

  • 申请/专利权人 NTN CORP;

    申请/专利号JP20180153463

  • 发明设计人 筒井 英之;谷 僚二;加藤 甲馬;

    申请日2018-08-17

  • 分类号G01M99/00;G01H17/00;

  • 国家 JP

  • 入库时间 2022-08-21 12:23:57

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