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FAILURE ANALYSIS SUPPORTING DEVICE, INCIDENT MANAGING SYSTEM, FAILURE ANALYSIS SUPPORTING METHOD, AND PROGRAM

机译:故障分析支持设备,事件管理系统,故障分析支持方法和程序

摘要

To provide a failure analysis supporting device which quickly presents an appropriate failure solution plan when a failure has occurred in a system.SOLUTION: The failure analysis supporting device includes an extraction unit, a generation unit, a calculation unit, and an output unit. The extraction unit specifies a format for each of error logs obtained from a monitoring object device, and extracts each of the specified format as a log pattern. The generation unit determines a log pattern to which each of the error logs contained in one day corresponds, and generates a log pattern list comprising the log patterns. The calculation unit calculates similarity between an error log at the occurrence of the failure and error logs in an incident occurring day on the basis of the error log at the occurrence of the failure and the log pattern list on the incident occurring day. The output unit outputs a failure solution of the incident estimated from the error log at the occurrence of the failure on the basis of the similarity.SELECTED DRAWING: Figure 1
机译:提供一种故障分析支持设备,当系统中发生故障时,该故障分析支持设备可以快速提出适当的故障解决方案。解决方案:故障分析支持设备包括提取单元,生成单元,计算单元和输出单元。提取单元针对从监视对象设备获得的每个错误日志指定格式,并且将所指定的每种格式提取为日志模式。生成单元确定一天中包含的每个错误日志所对应的日志模式,并生成包括日志模式的日志模式列表。计算单元基于故障发生时的错误日志和事件发生日的日志模式列表,计算故障发生时的错误日志与事件发生日的错误日志之间的相似度。输出单元根据相似性输出在故障发生时从错误日志中估算出的事件的故障解决方案。图1

著录项

  • 公开/公告号JP2019049802A

    专利类型

  • 公开/公告日2019-03-28

    原文格式PDF

  • 申请/专利权人 NEC CORP;

    申请/专利号JP20170172944

  • 发明设计人 HAGIWARA YASUHIRO;NISHIKAWA MASATOSHI;

    申请日2017-09-08

  • 分类号G06F11/07;

  • 国家 JP

  • 入库时间 2022-08-21 12:23:17

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