首页> 外国专利> Plasma processing process to improve in-situ chamber cleaning efficiency in plasma processing chamber

Plasma processing process to improve in-situ chamber cleaning efficiency in plasma processing chamber

机译:等离子体处理工艺可提高等离子体处理室中的原位腔室清洁效率

摘要

Embodiments of the present disclosure include methods for improving in-situ chamber cleaning efficiency for plasma processing chambers used in semiconductor substrate manufacturing processes. In one embodiment, a method for performing a plasma processing process after cleaning a plasma process comprises performing the cleaning process in a plasma processing chamber with the substrate not disposed thereon, followed by at least Supplying a plasma processing gas mixture comprising a hydrogen containing gas and / or an oxygen containing gas into the plasma processing chamber; and applying RF source power to the processing chamber to form a plasma from the plasma processing gas mixture; Plasma treating an inner surface of the processing chamber. [Selected figure] Figure 1
机译:本公开的实施例包括用于提高在半导体衬底制造工艺中使用的等离子体处理室的原位室清洁效率的方法。在一个实施例中,一种用于在清洁等离子体工艺之后执行等离子体处理工艺的方法,包括:在等离子体处理室中在其上未布置基板的情况下执行清洁工艺,然后至少提供包括含氢气体的等离子体处理气体混合物,以及/或将含氧气的气体送入等离子体处理室;向处理室施加射频源功率,以由等离子体处理气体混合物形成等离子体;等离子处理处理室的内表面。 [选定图]图1

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号