首页> 外国专利> WAVE HEIGHT FREQUENCY DISTRIBUTION ACQUISITION DEVICE, WAVE HEIGHT FREQUENCY DISTRIBUTION ACQUISITION METHOD, WAVE HEIGHT FREQUENCY DISTRIBUTION ACQUISITION PROGRAM, AND RADIATION IMAGING DEVICE

WAVE HEIGHT FREQUENCY DISTRIBUTION ACQUISITION DEVICE, WAVE HEIGHT FREQUENCY DISTRIBUTION ACQUISITION METHOD, WAVE HEIGHT FREQUENCY DISTRIBUTION ACQUISITION PROGRAM, AND RADIATION IMAGING DEVICE

机译:波高频率分布采集设备,波高频率分布采集方法,波高频率分布采集程序和辐射成像设备

摘要

To create a high-accuracy wave height frequency distribution in a short time and, furthermore, to reduce the cost of a radiation imaging device for which a detector using the wave height frequency distribution to calibrate is adapted.SOLUTION: Provided is a wave height frequency distribution acquisition device of a radiation detector equipped with a plurality of counting units which, when the value of a detection signal of an incident X-ray that is detected is greater than or equal to a threshold, counts the detection signals and outputs respective count values. The wave height frequency distribution acquisition device comprises: a threshold setting unit for setting a first threshold V1 to a first counting unit and setting a second threshold V2 higher than the first threshold V1 to a second counting unit, and resetting a first threshold V1' different from the first threshold V1 to the first counting unit; a measurement control unit for carrying out a plurality of measurements; and a wave height frequency distribution generation unit for generating a wave height frequency distribution for the first threshold in the first counting unit on the basis of a difference between the count values obtained by the first and second counting units through a plurality of measurements carried out in accordance with the measurement control unit.SELECTED DRAWING: Figure 8
机译:为了在短时间内创建高精度的波高频率分布,并降低放射线成像设备的成本,为此需要对使用波高频率分布进行校准的探测器进行调整。放射线检测器的分布获取装置,其配备有多个计数单元,当所检测到的入射X射线的检测信号的值大于或等于阈值时,对所述检测信号进行计数并输出各自的计数值。所述波高频率分布获取装置包括:阈值设置单元,用于将第一阈值V1设置为第一计数单元,并且将高于所述第一阈值V1的第二阈值V2设置为第二计数单元,并将不同的第一阈值V1'复位。从第一阈值V1到第一计数单元;测量控制单元,用于执行多个测量;波高频率分布产生单元,用于基于第一计数单元和第二计数单元通过多次测量获得的计数值之间的差,在第一计数单元中产生第一阈值的波高频率分布。符合测量控制单元。选定的图纸:图8

著录项

  • 公开/公告号JP2019020334A

    专利类型

  • 公开/公告日2019-02-07

    原文格式PDF

  • 申请/专利权人 HITACHI LTD;

    申请/专利号JP20170141057

  • 发明设计人 TAKAHASHI ISAO;

    申请日2017-07-20

  • 分类号G01T1/36;A61B6/03;G01T1/17;

  • 国家 JP

  • 入库时间 2022-08-21 12:20:16

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