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タンタル酸リチウム基板の評価方法

机译:钽酸锂基板的评价方法

摘要

PROBLEM TO BE SOLVED: To provide a simple method for evaluating degree of reduction in a reduced lithium tantalate substrate on the basis of specific volume resistance of the lithium tantalate substrate.;SOLUTION: A method for evaluating degree of reduction in a reduced lithium tantalate substrate on the basis of specific volume resistance of the lithium tantalate substrate, comprises measuring absorption coefficient of the lithium tantalate substrate with light having a wavelength of 600 nm; and determining that the specific volume resistance of the lithium tantalate substrate is within a range of 5×109-2×1011 Ω cm, where the lithium tantalate substrate exists under an environment that the measured absorption coefficient of the lithium tantalate substrate is within a range of 20-29 cm-1.;SELECTED DRAWING: Figure 2;COPYRIGHT: (C)2019,JPO&INPIT
机译:解决的问题:提供一种基于钽酸锂基板的单位体积电阻来评估还原钽酸锂基板的还原度的简单方法。解决方案:一种评估钽酸锂还原基板的还原度的方法基于钽酸锂基板的比容电阻,包括:用波长为600nm的光测量钽酸锂基板的吸收系数。并确定钽酸锂衬底的比电阻在5×10 9 -2×10 11 Ωcm的范围内,其中钽酸锂衬底存在于钽酸锂基体的吸收系数在20-29 cm -1 范围内的环境。选图:图2;版权:(C)2019,JPO&INPIT

著录项

  • 公开/公告号JP2019035675A

    专利类型

  • 公开/公告日2019-03-07

    原文格式PDF

  • 申请/专利权人 SUMITOMO METAL MINING CO LTD;

    申请/专利号JP20170157442

  • 发明设计人 佐藤 恵理子;

    申请日2017-08-17

  • 分类号G01N21/59;C30B33/02;C30B29/30;

  • 国家 JP

  • 入库时间 2022-08-21 12:20:14

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