首页> 外国专利> MASS ANALYSIS DATA PROCESSING DEVICE, MASS ANALYSIS SYSTEM AND MASS ANALYSIS DATA PROCESSING METHOD

MASS ANALYSIS DATA PROCESSING DEVICE, MASS ANALYSIS SYSTEM AND MASS ANALYSIS DATA PROCESSING METHOD

机译:质量分析数据处理装置,质量分析系统和质量分析数据处理方法

摘要

To provide a mass analysis data processing device, a mass analysis system and a mass analysis data processing method that can analyze a repetitive structure etc., of a sample from complicated mass spectral data many peaks of which are observed.SOLUTION: A mass analysis data processing device 10 comprises a data processing part 2c which generates a peak list and a computation part 11 provided at the data processing part 2c. The computation part 11 calculates differences d in mass between all peak data from a peak list and intensity ratios y as ratios of intensities I each between two peak data used to calculate a difference d so as to generate difference-intensity ratio data consisting of the differences d and intensity ratios y. Further, the computation part 11 retrieves difference-intensity ratio data having a difference d included in a section, calculates the total of intensity ratios y of retrieved difference-intensity ratio data, and calculates difference-intensity ratio distribution data consisting of the section of the difference and the total of the intensity ratio y.SELECTED DRAWING: Figure 3
机译:为了提供一种质量分析数据处理装置,质量分析系统和质量分析数据处理方法,可以从观察到许多峰的复杂质谱数据中分析样品的重复结构等。处理设备10包括产生峰值列表的数据处理部分2c和设置在数据处理部分2c处的计算部分11。计算部分11从峰列表计算所有峰数据之间的质量差d和作为用于计算差d的两个峰数据之间的强度比I的强度比y,以生成由差构成的差强度比数据d和强度比y。此外,计算部11检索包含在区间中的具有差d的差强度比数据,计算出所求出的差强度比数据的强度比y的合计,计算出由该区间的区间构成的差强度比分布数据。强度比y的总和。选定的图:图3

著录项

  • 公开/公告号JP2019035719A

    专利类型

  • 公开/公告日2019-03-07

    原文格式PDF

  • 申请/专利权人 JEOL LTD;

    申请/专利号JP20170158915

  • 发明设计人 KUBO AYUMI;

    申请日2017-08-21

  • 分类号G01N27/62;

  • 国家 JP

  • 入库时间 2022-08-21 12:20:13

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