首页> 外国专利> Factor analysis method

Factor analysis method

机译:因子分析法

摘要

PROBLEM TO BE SOLVED: To provide an element analysis method capable of analyzing impurity elements in a sample including a silicon containing compound with accuracy 1,000 times compared with conventional one while preventing an element analyzer from being blocked by the deposition of a silicon matrix.SOLUTION: The method for analyzing impurity elements in a sample including a silicon containing compound comprises: decomposing the silicon containing compound included in the sample using an automatic vapor phase decomposition apparatus including at least a heating mechanism, a liquid sending mechanism and a conveyance mechanism; removing a silicon part in the sample after the decomposition to prepare a sample for element analysis; automatically injecting the prepared sample for element analysis into the element analyzer; and analyzing impurity elements in the sample for element analysis.SELECTED DRAWING: Figure 1
机译:解决的问题:提供一种元素分析方法,该方法能够分析包括含硅化合物的样品中的杂质元素,其准确度是传统方法的1000倍,同时又可以防止元素分析仪被硅基质的沉积所阻塞。分析包含含硅化合物的样品中的杂质元素的方法包括:使用至少包括加热机构,液体传送机构和输送机构的自动气相分解装置分解样品中包含的含硅化合物;和分解后去除样品中的硅部分,以制备样品进行元素分析;自动将准备好的用于元素分析的样品注入元素分析仪;并分析样品中的杂质元素以进行元素分析。选图:图1

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号