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CHARGED PARTICLE BEAM DISTRIBUTION MEASUREMENT SYSTEM, AND CHARGED PARTICLE BEAM DISTRIBUTION MEASUREMENT METHOD

机译:带电粒子束分布测量系统及带电粒子束分布测量方法

摘要

PROBLEM TO BE SOLVED: To provide a charged particle beam distribution measurement system 8 and a charged particle beam distribution measurement method having resistance to a neutron beam, and capable of measuring distribution of a charged particle beam regardless of a shape of the beam.SOLUTION: A charged particle beam distribution measurement system 8 includes: a shielding film 17 in which a temperature change occurs in an irradiation region 18 when being irradiated with a charged particle beam; a cooling part 20 that cools at least a part of the shielding film 17 other than the irradiation region 18 of the shielding film 17; an infrared camera 15 that measures at least temperature distribution of the irradiation region 18 of the shielding film 17; and a computer 7 that calculates beam distribution from the temperature distribution measured by the infrared camera 15.
机译:解决的问题:提供一种带电粒子束分布测量系统8和一种带电粒子束分布测量方法,该系统具有对中子束的抵抗力,并且能够测量带电粒子束的分布而与束的形状无关。带电粒子束分布测量系统8包括:遮蔽膜17,当被带电粒子束照射时,在照射区域18中温度发生变化;冷却部20,其对除了遮蔽膜17的照射区域18以外的遮蔽膜17的至少一部分进行冷却。红外照相机15,其至少测量遮蔽膜17的照射区域18的温度分布。计算机7,其根据由红外照相机15测量的温度分布来计算光束分布。

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