An analysing system for concurrent energy and angular distribution measurements of charged particles' emission

摘要

A theoretical treatment of an electron-optical scheme is suggested. The system can be used for simultaneous registration of energy and angular distributions of charged particles (electrons or ions) emitted from a small source. The scheme is based on an axially calculated symmetrical electrostatic field. The source has the form of a short interval of the axis of symmetry. The system consists of a novel type of electrostatic energy analyser and an usual planar position-sensitive detector joined to it.