首页> 外国专利> RAMAN PROBE, RAMAN SPECTRUM OBTAINING APPARATUS, AND METHOD OF OBTAINING RAMAN SPECTRUM AND DETECTING DISTRIBUTION OF TARGET MATERIAL USING RAMAN PROBE

RAMAN PROBE, RAMAN SPECTRUM OBTAINING APPARATUS, AND METHOD OF OBTAINING RAMAN SPECTRUM AND DETECTING DISTRIBUTION OF TARGET MATERIAL USING RAMAN PROBE

机译:拉曼探针,拉曼光谱获得装置以及使用拉曼探针获得拉曼光谱并检测目标材料的分布的方法

摘要

A Raman probe provided includes a light source part configured to emit light on a sample, and further configured to adjust at least one of an incident angle of the light, a position of an emission point of the light, and a focal point of the light source part, a light collector configured to collect Raman scattered light from the sample, and further configured to adjust a field of view of Raman measurement and a focal point of the light collector, and a photodetector configured to receive the collected Raman scattered light, wherein the light source part comprises a reflection mirror configured to rotate to adjust the position of the emission point of the light.
机译:所提供的拉曼探针包括光源部分,该光源部分被配置为在样品上发光,并且进一步被配置为调整光的入射角,光的发射点的位置和光的焦点中的至少一个。源部,被配置为收集来自样本的拉曼散射光,并且还被配置为调整拉曼测量的视野和光收集器的焦点的光收集器,以及被配置为接收所收集的拉曼散射光的光电探测器,其中光源部分包括反射镜,反射镜构造成旋转以调节光的发射点的位置。

著录项

  • 公开/公告号US2019277764A1

    专利类型

  • 公开/公告日2019-09-12

    原文格式PDF

  • 申请/专利权人 SAMSUNG ELECTRONICS CO. LTD.;

    申请/专利号US201916297153

  • 发明设计人 HO JUN CHANG;WOO CHANG LEE;

    申请日2019-03-08

  • 分类号G01N21/65;

  • 国家 US

  • 入库时间 2022-08-21 12:13:48

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