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Linearity and lateral isolation in a BiCMOS process through counter-doping of epitaxial silicon region
Linearity and lateral isolation in a BiCMOS process through counter-doping of epitaxial silicon region
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机译:通过反向掺杂外延硅区域实现BiCMOS工艺中的线性和横向隔离
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摘要
Methods for providing improved isolation structures in a SiGe BiCMOS process are provided. In one method, an n-type epitaxial layer is grown over a p-type high-resistivity substrate. A mask covers a first region, and exposes a second region, of the epitaxial layer. A p-type impurity is implanted through the mask, counter-doping the second region to become slightly p-type. Shallow trench isolation and optional deep trench isolation regions are formed through the counter-doped second region, providing an isolation structure. The first region of the epitaxial layer forms a collector region of a heterojunction bipolar transistor. In another method, shallow trenches are etched partially into the epitaxial layer through a mask. A p-type impurity is implanted through the mask, thereby counter-doping thin exposed regions of the epitaxial layer to become slightly p-type. The shallow trenches are filled with dielectric material and a CMP process is performed to form shallow trench isolation regions.
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