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Method and system for multi-path active defect detection, localization and characterization with ultrasonic guided waves

机译:超声导波进行多径有源缺陷检测,定位和表征的方法和系统

摘要

A method and system of detecting, localizing, and characterizing a defect at one or more spatial points of interest on a structure. The method may include collecting first data in a first state using one or more transducers on the structure, collecting second data in a second state subsequent to the first state, computing a scattered impulse response based on the collected first data and the collected second data, comparing the scattered impulse response with an estimated scattered impulse response corresponding to the case when damage is present at one or more spatial points of interest on the structure, and combining the generated comparison results to detect, localize, and characterize a defect at the one or more spatial points of interest on the structure.
机译:一种在结构上的一个或多个感兴趣的空间点处检测,定位和表征缺陷的方法和系统。该方法可以包括:使用结构上的一个或多个换能器收集处于第一状态的第一数据;收集在第一状态之后处于第二状态的第二数据;基于所收集的第一数据和所收集的第二数据来计算散射的脉冲响应;将分散的脉冲响应与估计的分散的脉冲响应进行比较,该估计的分散的脉冲响应对应于在结构上一个或多个感兴趣的空间点处存在损坏的情况,并结合生成的比较结果以检测,定位和表征一个或多个缺陷在结构上有更多的空间兴趣点。

著录项

  • 公开/公告号US10126274B2

    专利类型

  • 公开/公告日2018-11-13

    原文格式PDF

  • 申请/专利权人 HIDDEN SOLUTIONS LLC;

    申请/专利号US201314396373

  • 申请日2013-01-25

  • 分类号G01N29/44;G01N29/04;G01M7/02;G01N29/24;

  • 国家 US

  • 入库时间 2022-08-21 12:12:05

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