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SAMPLE FOR MEASURING PARTICLES, METHOD FOR MEASURING PARTICLES AND APPARATUS FOR MEASURING PARTICLES

机译:测量颗粒的样品,测量颗粒的方法和测量颗粒的装置

摘要

To provide a sample for measuring particles enabling the three-dimensional particulate shape to be measured and the particulate species to be evaluated, the sample for measuring particles includes a substrate; isolated nanoparticles to be measured which are disposed on the substrate; and isolated standard nanoparticles which are disposed on the substrate in the vicinity of the isolated nanoparticles to be measured.
机译:为了提供用于测量颗粒的样品,该颗粒能够测量三维颗粒形状并评估颗粒种类,该颗粒测量样品包括基材;被测量的分离的纳米颗粒,其布置在基底上;分离的标准纳米颗粒,其设置在待测分离的纳米颗粒附近的基底上。

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