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Sample for measuring particles, method for measuring particles and apparatus for measuring particles

摘要

To provide a sample for measuring particles enabling the three-dimensional particulate shape to be measured and the particulate species to be evaluated, the sample for measuring particles includes a substrate; isolated nanoparticles to be measured which are disposed on the substrate; and isolated standard nanoparticles which are disposed on the substrate in the vicinity of the isolated nanoparticles to be measured.

著录项

  • 公开/公告号US10697767B2

    专利类型

  • 公开/公告日2020.06.30

    原文格式PDF

  • 申请/专利权人

    申请/专利号US16325590

  • 申请日2016.08.31

  • 分类号

  • 国家 US

  • 入库时间 2022-08-21 10:59:34

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