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Sample for measuring particles, method for measuring particles and apparatus for measuring particles
Sample for measuring particles, method for measuring particles and apparatus for measuring particles
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摘要
To provide a sample for measuring particles enabling the three-dimensional particulate shape to be measured and the particulate species to be evaluated, the sample for measuring particles includes a substrate; isolated nanoparticles to be measured which are disposed on the substrate; and isolated standard nanoparticles which are disposed on the substrate in the vicinity of the isolated nanoparticles to be measured.
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