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Light distribution characteristic measurement apparatus and light distribution characteristic measurement method

机译:配光特性测定装置及配光特性测定方法

摘要

A light distribution characteristic measurement apparatus includes an imaging unit disposed at a predetermined distance from a light source, a movement mechanism that successively changes a positional relation of the imaging unit with respect to the light source, while keeping the distance between the light source and the imaging unit, and a processing module that calculates the light distribution characteristic of the light source. The processing module obtains a plurality of image data taken under a first imaging condition and a plurality of image data taken under a second imaging condition different from the first condition, and determines corrected image information corresponding to a relative position of interest, from first image information corresponding to the relative position of interest included in the image data taken under the first condition and second image information corresponding to the relative position of interest included in the image data taken under the second condition.
机译:配光特性测量装置包括:成像单元,该成像单元与光源相距预定距离;移动机构,其在保持光源与光源之间的距离的同时,连续改变成像单元相对于光源的位置关系。成像单元和处理模块,该处理模块计算光源的光分布特性。处理模块获得在第一成像条件下拍摄的多个图像数据和在与第一条件不同的第二成像条件下拍摄的多个图像数据,并从第一图像信息中确定与感兴趣的相对位置相对应的校正图像信息。对应于在第一条件下拍摄的图像数据中包括的相对感兴趣位置的第二信息和与在第二条件下拍摄的图像数据中包括的感兴趣相对位置的第二图像信息。

著录项

  • 公开/公告号US10127472B2

    专利类型

  • 公开/公告日2018-11-13

    原文格式PDF

  • 申请/专利权人 OTSUKA ELECTRONICS CO. LTD.;

    申请/专利号US201615041320

  • 发明设计人 YOSHI ENAMI;YOSHIHIKO NISHIDA;

    申请日2016-02-11

  • 分类号G01C3/08;G06K9/46;G01J1/42;G06T7;G06K9/20;

  • 国家 US

  • 入库时间 2022-08-21 12:11:48

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