Apparatus and/or method for performing single-shot network analysis of electrical, electronic and electro-optical elements (e.g., components, circuits, modules, sub-systems and/or systems) on a device, or devices, under test (DUT). A pulsed optical source is directed through a first dispersion element to an modulator, while a delayed version of the pulsed optical source is directed to the DUT (pulsed optical source converted to electrical signal if DUT has electrical input), whose electrical output is fed to the modulator whose modulated optical pulse output is stretched through a second optical dispersion element, then converted to an electrical signal and processed to provide analysis and/or display of DUT response.
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