The present technology relates a transformer condition monitoring system including a light source configured to produce an emitted light beam. A plurality of optical sensors are configured to be positioned at a plurality of separate locations on a transformer, receive the light beam from the light source, and generate product light beams from the emitted light beam. A detector is positioned to receive the product light beams from the optical sensors and is configured to measure intensity values of the product light beams for each of the optical sensors. A computing device is coupled to the detector and includes a processor coupled to a memory. The processor executes programmed instructions stored in the memory to determine, based on the measured intensity values for the product light beams for the optical sensors, at least a displacement value, a current value, and a voltage value for the transformer.
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