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Compact electronics test system having user programmable device interfaces and on-board functions adapted for use in proximity to a radiation field
Compact electronics test system having user programmable device interfaces and on-board functions adapted for use in proximity to a radiation field
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机译:紧凑的电子测试系统,具有用户可编程设备接口和适合在辐射场附近使用的板上功能
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摘要
Various apparatus and methods associated with a compact electronics test system having user programmable device interfaces and on-board functions adapted for use in various environments are provided. Exemplary embodiments can include a variety of apparatuses and methods to realize an advanced field programmable gate array adapted to perform functional tests on digital electronics within an exemplary 48-pin DIP footprint. One aspect of the invention can include a testing device comprised of components to produce a product that is inexpensive and consumable. A small size of an exemplary embodiment of the invention further allows for desirable shielding to be placed around a highly portable and highly programmable and adaptable testing device in order to protect it from external dangers found in harsh environments (e.g., high levels of radiation when operating in space, etc.).
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