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System Architecture Method and Apparatus for Adaptive Hardware Fault Detection with Hardware Metrics Subsystem
System Architecture Method and Apparatus for Adaptive Hardware Fault Detection with Hardware Metrics Subsystem
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机译:带有硬件度量子系统的自适应硬件故障检测的系统架构方法和装置
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摘要
A method, system, and architecture (100) for adaptively field testing for hardware faults on an integrated circuit device includes a central quality assurance server (121) which receives specified hardware metric data (131) monitored at an integrated circuit device (110) in the field, identifies prioritized built-in self-test (BIST) fault detection tests (134) based on the specified hardware metric data, securely downloads the prioritized BIST fault detection tests (132) to the integrated circuit device for execution to identify a first hardware fault at the integrated circuit device, and then receives diagnosis information (133) identifying the first hardware fault from the integrated circuit device which is used to update the prioritized BIST fault detection tests.
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