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PROCESSOR AND CHIPSET CONTINUITY TESTING OF PACKAGE INTERCONNECT FOR FUNCTIONAL SAFETY APPLICATIONS
PROCESSOR AND CHIPSET CONTINUITY TESTING OF PACKAGE INTERCONNECT FOR FUNCTIONAL SAFETY APPLICATIONS
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机译:用于功能安全应用的包装互连的处理器和芯片组连续性测试
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摘要
Methods and apparatus relating to processor and chipset continuity testing of package interconnect for functional safety applications are described. In an embodiment, voltage divider logic circuitry divides a reference voltage. Controller logic circuitry compares a divided voltage value from a node of the voltage divider logic circuitry and a threshold voltage value. A first end of the voltage divider logic circuitry is coupled to receive the reference voltage and a second end of the voltage divider logic circuitry is coupled to a Non-Critical-To-Function (NCTF) solder ball. The controller logic circuitry generates an error signal in response to a mismatch between the divided voltage value and the threshold voltage value. Other embodiments are also disclosed and claimed.
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