首页> 外国专利> SYSTEM AND METHOD FOR FACTORY CALIBRATION OR REDUCED CALIBRATION OF AN INDWELLING SENSOR BASED ON SENSITIVITY PROFILE AND BASELINE MODEL OF SENSORS

SYSTEM AND METHOD FOR FACTORY CALIBRATION OR REDUCED CALIBRATION OF AN INDWELLING SENSOR BASED ON SENSITIVITY PROFILE AND BASELINE MODEL OF SENSORS

机译:基于灵敏度曲线和传感器基线模型的插值传感器的出厂标定或缩小标定的系统和方法

摘要

Systems and methods are disclosed which provide for a “factory-calibrated” sensor. In doing so, the systems and methods include predictive prospective modeling of sensor behavior, and also include predictive modeling of physiology. With these two correction factors, a consistent determination of sensitivity can be achieved, thus achieving factory calibration.
机译:公开了提供“工厂校准”传感器的系统和方法。这样做时,该系统和方法包括传感器行为的预测性前瞻性建模,并且还包括生理学的预测性建模。利用这两个校正因子,可以实现灵敏度的一致确定,从而实现出厂校准。

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