DETERMINING THE THICKNESS OF A SUBMICRON CARBON COATING ON A CARBON-COATED METAL BASE PLATE USING RAMAN SPECTROSCOPY

摘要

A method of determining a thickness of a submicron carbon of a carbon-coated metal base plate that includes conducting Raman spectroscopy at a target location of the carbon-coated metal base plate to obtain a Raman shift spectrum for the target location. The Raman shift spectrum obtained at the target location is then converted into a calculated thickness of the submicron carbon coating at the target location. The conversion of the Raman shift spectrum into the calculated thickness of the submicron carbon coating at the target location may involve referencing a linear correlation that has been established over the defined wavenumber range between (1) an integrated intensity of a Raman carbon signal obtained from each of a series of reference plates that includes a submicron carbon coating having a verified thickness and (2) the verified thicknesses of the submicron carbon coatings of the series of reference plates.