DETERMINING THE THICKNESS OF A SUBMICRON CARBON COATING ON A CARBON-COATED METAL BASE PLATE USING RAMAN SPECTROSCOPY

摘要

A method for determining a submicron carbon thickness of a carbon-coated metal base plate involving performing Raman spectroscopy on a target site of the carbon-coated metal base plate to obtain a Raman shift spectrum for the target site. The Raman shift spectrum obtained at the target site is then converted to a calculated thickness of submicron carbon coating at the target site. The conversion of the Raman shift spectrum to the calculated thickness of the submicron carbon coating at the target site may include the referencing of a linear correlation over the defined wavenumber range between (1) an integrated intensity of a Raman carbon signal from each of a number of Obtained reference plates having a sub-micron carbon coating with a verified thickness, and (2) the verified thicknesses of submicron carbon coatings of the series of reference plates.