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Light-emitting apparatus, calibration coefficient calculation method, and method for calibrating captured image of examination target item

机译:发光装置,校正系数计算方法以及对检查对象物的拍摄图像进行校正的方法

摘要

Provided are a light-emitting apparatus that can suppress manufacturing cost to a low level and perform light emission with high uniformity using a simple configuration, a calibration coefficient calculation method using the light-emitting apparatus, and a method for calibrating a captured image of an inspection target object. A plurality of light-emitting diodes arranged at equal intervals on the circumference of a virtual circle, and a milky white-colored emission window, which is provided on a top surface portion separated from the light-emitting diodes, has an outer edge that is smaller than the circumference on which the light-emitting diodes are arranged, and allows light of the light-emitting diodes to pass therethrough, are included. The diameter of the virtual circle on which the light-emitting diodes are arranged and a separation distance between the light-emitting diodes and the emission window are set to predetermined distances.
机译:本发明提供一种发光装置,其可以通过简单的结构将制造成本抑制到较低的水平,并且可以以高的均匀性进行发光;使用该发光装置的校准系数计算方法;以及用于对被摄体的拍摄图像进行校准的方法。检查目标对象。在假想圆的圆周上等间隔地配置有多个发光二极管,在与发光二极管分离的顶面部设置的乳白色的发光窗的外缘为包括小于其上布置有发光二极管的圆周并且允许发光二极管的光通过的圆周。将其上布置有发光二极管的假想圆的直径以及在发光二极管与发射窗口之间的间隔距离设置为预定距离。

著录项

  • 公开/公告号US10145538B2

    专利类型

  • 公开/公告日2018-12-04

    原文格式PDF

  • 申请/专利权人 IIX INC.;

    申请/专利号US201615545982

  • 发明设计人 HIROSHI MURASE;TOMOYUKI TAKANO;

    申请日2016-01-27

  • 分类号F21V11;F21V9/08;F21K9/64;G01C11/02;G06T5;G02F1/13;G02F1/13357;H04N17;F21Y113/13;F21Y115/10;F21K99;G01N21/93;

  • 国家 US

  • 入库时间 2022-08-21 12:08:00

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