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PREPARATION METHOD OF BOTTOM-GATE TYPE LOW-TEMPERATURE POLYSILICON TRANSISTOR

机译:底部浇口型低温多晶硅晶体管的制备方法

摘要

A preparation method of a bottom-gate type low-temperature polysilicon transistor is disclosed in the present disclosure. The preparation method includes: preparing a first stack structure on a substrate; preparing a polysilicon layer and an etch stop layer in sequence on the first stack structure; patterning the polysilicon layer and the etch stop layer at the same time so that the etch stop layer covers portions of the polysilicon layer; implanting ions into the polysilicon layer that is not covered by the etch stop layer to form a source/drain region of the low-temperature polysilicon transistor. In this way, the present disclosure can simplify the manufacturing process and save the manufacturing cost.
机译:本发明公开了一种底栅型低温多晶硅晶体管的制备方法。该制备方法包括:在基板上制备第一堆叠结构;在第一堆叠结构上依次制备多晶硅层和蚀刻停止层;同时图案化多晶硅层和蚀刻停止层,使得蚀刻停止层覆盖多晶硅层的一部分;将离子注入到未被蚀刻停止层覆盖的多晶硅层中,以形成低温多晶硅晶体管的源/漏区。这样,本公开可以简化制造过程并节省制造成本。

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