首页>
外国专利>
TEST CIRCUITS FOR INTEGRATED CIRCUIT COUNTERFEIT DETECTION
TEST CIRCUITS FOR INTEGRATED CIRCUIT COUNTERFEIT DETECTION
展开▼
机译:综合电路伪造检测的测试电路
展开▼
页面导航
摘要
著录项
相似文献
摘要
Described herein are various technologies pertaining to identifying counterfeit integrated circuits (ICs) by way of allowing the origin of fabrication to be verified. An IC comprises a main circuit and a test circuit that is independent of the main circuit. The test circuit comprises at least one ring oscillator (RO) signal that, when energized, is configured to output a signal that is indicative of a semiconductor fabrication facility where the IC was manufactured.
展开▼